2022
IST, "Crex: Predicting Patch Correctness in Automated Repair of C Programs through Transfer Learning of Execution Semantics"
Dapeng Yan, Kui Liu, Yuqing Niu, Li Li, Zhe Liu, Zhiming Liu, Jacques Klein, and Tegawendé F. Bissyandé, "Crex: Predicting Patch Correctness in Automated Repair of C Programs through Transfer Learning of Execution Semantics", in Information and Software Technology, 2022.
ASE-22, "Is this Change the Answer to that Problem? Correlating Descriptions of Bug and Code Changes for Evaluating Patch Correctness"
Haoye Tian, Xunzhu Tang, Andrew Habib, Shangwen Wang, Kui Liu, Xin Xia, Jacques Klein, and Tegawendé F. Bissyandé, "Is this Change the Answer to that Problem? Correlating Descriptions of Bug and Code Changes for Evaluating Patch Correctness", in Proceedings of the 37th IEEE/ACM International Conference on Automated Software Engineering, Ann Arbor, Michigan, United States, 2022.
ICSME-22, "Peeler: Learning to Effectively Predict Flakiness without Running Tests"
Yihao Qin, Shangwen Wang, Kui Liu, Bo Lin, Hongjun Wu, Li Li, Xiaoguang Mao, and Tegawendé F. Bissyandé, "Peeler: Learning to Effectively Predict Flakiness without Running Tests", in Proceedings of the 38th International Conference on Software Maintenance and Evolution, Limassol, Cyprus, 2022.
JSS, "DigBug—Pre/post-processing operator selection for accurate bug localization"
Kisub Kim, Sankalp Ghatpande, Kui Liu, Anil Koyuncu, Dongsun Kim, Tegawendé F. Bissyandé, Jacques Klein, Yves LeTraon, "DigBug—Pre/post-processing operator selection for accurate bug localization", in Journal of Systems and Software, 2022.
TOSEM, "Predicting Patch Correctness Based on the Similarity of Failing Test Cases"
Haoye Tian, Yinghua Li, Weiguo Pian, Abdoul Kader Kabore, Kui Liu, Andrew Habib, Jacques Klein, and Tegawendé F. Bissyandé, "Predicting Patch Correctness Based on the Similarity of Failing Test Cases", in ACM Transactions on Software Engineering and Methodology, 2022.
2021
QRS-21, "Estimating the Attack Surface from Residual Vulnerabilities in Open Source Software Supply Chain"
Dapeng Yan, Yuqing Niu, Kui Liu, Zhe Liu, Zhiming Liu, and Tegawendé F. Bissyandé, "Estimating the Attack Surface from Residual Vulnerabilities in Open Source Software Supply Chain", in Proceedings of the 21st IEEE International Conference on Software Quality, Reliability and Security, Hainan Island, China, December 6 - 10, 2021.
ICSME-21, "SMARTGIFT: Learning to Generate Practical Inputs for Testing Smart Contracts"
Teng Zhou, Kui Liu, Li Li, Zhe Liu, Jacques Klein and Tegawendé F. Bissyandé, "SMARTGIFT: Learning to Generate Practical Inputs for Testing Smart Contracts", in Proceedings of the 29th IEEE/ACM International Conference on Program Comprehension, Luxembourg City, Luxembourg, 2021.
ICSME-21, "Revisiting Test Cases to Boost Generate-and-Validate Program Repair"
Jingtang Zhang, Kui Liu, Dongsun Kim, Li Li, Zhe Liu, Jacques Klein and Tegawendé F. Bissyandé, "Revisiting Test Cases to Boost Generate-and-Validate Program Repair", in Proceedings of the 29th IEEE/ACM International Conference on Program Comprehension, Luxembourg City, Luxembourg, 2021.
EMSE, "Where Were the Repair Ingredients for Defects4J Bugs? Exploring the Impact of Repair Ingredient Retrieval on the Performance of 24 Program Repair Systems"
Deheng Yang, Kui Liu, Dongsun Kim, Anil Koyuncu, Kisub Kim, Haoye Tian, Yan Lei, Xiaoguang Mao, Jacques Klein and Tegawendé F. Bissyandé, "Where Were the Repair Ingredients for Defects4J Bugs? Exploring the Impact of Repair Ingredient Retrieval on the Performance of 24 Program Repair Systems", in Empirical Software Engineering, 2021.
ICPC-21, "Automated Comment Update: How Far are We?"
Bo Lin, Shangwen Wang, Kui Liu, Xiaoguang Mao, and Tegawendé F. Bissyandé, "Automated Comment Update: How Far are We?", in Proceedings of the 29th IEEE/ACM International Conference on Program Comprehension, Virtual, 2021.
SANER-21, "On the Impact of Flaky Tests in Automated Program Repair"
Yihao Qin, Shangwen Wang, Kui Liu, Xiaoguang Mao, and Tegawendé F. Bissyandé, "On the Impact of Flaky Tests in Automated Program Repair", in Proceedings of the 28th IEEE International Conference on Software Analysis, Evolution and Reengineering, Virtual, March 9-12, 2021.
2020
JSS, "A Critical Review on the Evaluation of Automated Program Repair Systems"
Kui Liu, Li Li, Anil Koyuncu, Dongsun Kim, Zhe Liu, Jacques Klein, and Tegawendé F. Bissyandé, "A Critical Review on the Evaluation of Automated Program Repair Systems", in Journal of Systems and Software, 2020.
ASE-20, "Evaluating Representation Learning of Code Changes for Predicting Patch Correctness in Program Repair"
Haoye Tian, Kui Liu, Abdoul Kader Kaboré, Anil Koyuncu, Li Li, Jacques Klein, and Tegawendé F. Bissyandé, "Evaluating Representation Learning of Code Changes for Predicting Patch Correctness in Program Repair", in Proceedings of the 35th IEEE/ACM International Conference on Automated Software Engineering, Melbourne, Australia, September 21-25, 2020.
ICSE-20, "On the efficiency of Test Suite based Program Repair: A Systematic Assessment of 16 Automated Repair Systems for Java Programs"
Kui Liu, Shangwen Wang, Anil Koyuncu, Tegawendé F. Bissyandé, Dongsun Kim, Peng Wu, Jacques Klein, Xiaoguang Mao and Yves Le Traon, "On the efficiency of Test Suite based Program Repair: A Systematic Assessment of 16 Automated Repair Systems for Java Programs", in Proceedings of the 42nd International Conference on Software Engineering, Seoul, South Korea, May 23-29, 2020. [pdf] [bib]
EMSE, "FixMiner: Mining Relevant Fix Patterns for Automated Program Repair"
Anil Koyuncu, Kui Liu, Tegawendé F. Bissyandé, Dongsun Kim, Martin Monperrus, Jacques Klein and Yves Le Traon, "FixMiner: Mining Relevant Fix Patterns for Automated Program Repair", in Empirical Software Engineering, 2020. [pdf] [bib]
2019
ESEC/FSE-19, "iFixR: Bug Report driven Program Repair"
Anil Koyuncu, Kui Liu, Tegawendé F. Bissyandé, Dongsun Kim, Martin Monperrus, Jacques Klein and Yves Le Traon, "iFixR: Bug Report driven Program Repair", in Proceedings of the 27th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, Tallinn, Estonia, 2019. [pdf] [bib]
ISSTA-19, "TBar: Revisiting Template-based Automated Program Repair"
Kui Liu, Anil Koyuncu, Dongsun Kim and Tegawendé F. Bissyandé, "TBar: Revisiting Template-based Automated Program Repair", in Proceedings of the 28th ACM SIGSOFT International Symposium on Software Testing and Analysis, Beijing, China, 2019. [pdf] [bib]
ICST-19, "You Cannot Fix What You Cannot Find! An Investigation of Fault Localization Bias in Benchmarking Automated Program Repair Systems"
Kui Liu, Anil Koyuncu, Tegawendé F. Bissyandé, Dongsun Kim, Jacques Klein, and Yves Le Traon, "You Cannot Fix What You Cannot Find! An Investigation of Fault Localization Bias in Benchmarking Automated Program Repair Systems", in Proceedings of the 12th International Conference on Software Testing, Verification and Validation, Xi'an, China, 2019. [pdf] [bib]
ICSE-19, "Learning to Spot and Refactor Inconsistent Method Names"
Kui Liu, Dongsun Kim, Tegawendé F. Bissyandé, Taeyoung Kim, Kisub Kim, Anil Koyuncu, Suntae Kim, and Yves Le Traon, "Learning to Spot and Refactor Inconsistent Method Names", in Proceedings of the 41st International Conference on Software Engineering, Montréal, Canada, 2019. [pdf] [bib]
SANER-19, "AVATAR: Fixing Semantic Bugs with Fix Patterns of Static Analysis Violations"
Kui Liu, Anil Koyuncu, Dongsun Kim, Li Li, and Tegawendé F. Bissyandé, "AVATAR: Fixing Semantic Bugs with Fix Patterns of Static Analysis Violations", in Proceedings of the 26th IEEE International Conference on Software Analysis, Evolution, and Reengineering, Hang'zhou, China, 2019. [pdf] [bib]
TSE, "Mining Fix Patterns for FindBugs Violations"
Kui Liu, Dongsun Kim, Tegawendé F. Bissyandé, Shin Yoo, and Yves Le Traon, "Mining Fix Patterns for FindBugs Violations", in IEEE Transactions on Software Engineering. Accepted as a Journal-first paper at the 41st International Conference on Software Engineering, Montréal, QC, Canada, May 25–31, 2019. [pdf] [bib]
2018
APSEC-ERA-18, "LSRepair: Live Search of Fix Ingredients for Automated Program Repair"
Kui Liu, Anil Koyuncu, Kisub Kim, Dongsun Kim, and Tegawendé F. Bissyandé, "LSRepair: Live Search of Fix Ingredients for Automated Program Repair", in Proceedings of the 25th Asia-Pacific Software Engineering Conference - ERA Track, Nara, Japan, 2018, pp. 658-662.
Best ERA Paper Award Winner.
[pdf]
[bib]
ICSME-18, "A Closer Look at Real-World Patches"
Kui Liu, Dongsun Kim, Li Li, Anil Koyuncu, Tegawendé F. Bissyandé and Yves Le Traon, "A Closer Look at Real-World Patches", in Proceedings of the 34th IEEE International Conference on Software Maintenance and Evolution, Madrid, Spain, 2018, pp. 275-286. [pdf] [bib]
ISSTA-18, "Bench4BL: Reproducibility Study on the Performance of IR-Based Bug Localization"
Jaekwon Lee, Dongsun Kim, Tegawendé F. Bissyandé, Woosung Jung and Yves Le Traon, "Bench4BL: Reproducibility Study on the Performance of IR-Based Bug Localization", in Proceedings of the 27th International Symposium on Software Testing and Analysis, Amsterdam, Netherlands, 2018, pp. 61-72. [pdf] [bib]
ICSE-18, "FaCoY – A Code-to-Code Search Engine"
Kisub Kim, Dongsun Kim, Tegawendé F. Bissyandé, Eunjong Choi, Li Li, Jacques Klein, and Yves Le Traon, "FaCoY – A Code-to-Code Search Engine", in Proceedings of the 40th International Conference on Software Engineering, Gothenburg, Sweden, 2018, pp. 946-957. [pdf] [bib]
2017
EMSE, "Augmenting and Structuring User Queries to Support Efficient Free-Form Code Search"
Raphael Sirres, Tegawendé F. Bissyandé, Dongsun Kim, David Lo, Jacques Klein, Kisub Kim, and Yves Le Traon, "Augmenting and Structuring User Queries to Support Efficient Free-Form Code Search", Empirical Software Engineering Journal. [pdf] [bib]
ISSTA-17, "Impact of Tool Support in Patch Construction"
Anil Koyuncu, Tegawendé. F. Bissyandé, Dongsun Kim, Jacques Klein, Martin Monperrus, and Yves Le Traon, "Impact of Tool Support in Patch Construction," in Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis, New York, NY, USA, 2017, pp. 237–248. [pdf] [bib]